Tracking a reference signal is one of the major problems of an atomic force microscope (AFM). This article presents the design and experimental implementation of a model predictive control (MPC) scheme, with a vibration compensator for achieving accurate tracking for an AFM at higher scanning rates. To evaluate the improvement in performance attained by this control scheme, an experimental comparison of its tracked signals against different reference signals at different scanning rates is conducted. The experimental results demonstrate the effectiveness of the proposed controller.
Conference paper
Improvement of the tracking accuracy of an AFM using MPC
IEEE
8th IEEE Conference on Industrial Electronics and Applications (Melbourne, Victoria, 19-21 June)
2013
Metrics
19 Record Views
Abstract
Details
- Title
- Improvement of the tracking accuracy of an AFM using MPC
- Creators
- M S Rana - University of New South WalesH R Pota - University of New South WalesI R Petersen - University of New South WalesH Habibullah - University of New South Wales
- Conference
- 8th IEEE Conference on Industrial Electronics and Applications (Melbourne, Victoria, 19-21 June)
- Publisher
- IEEE; New Jersey, USA
- Identifiers
- 4492; 991012820609002368
- Academic Unit
- School of Environment, Science and Engineering; Faculty of Science and Engineering
- Resource Type
- Conference paper